Press Release- 2018 Phil Kaufman Awardee Announced

Tom Williams post img

Dr. Williams is being honored for his outstanding contributions to test automation and his overall impact on the electronics industry. He was a key contributor to the development of test automation tools, including Level Sensitive Scan Design (LSSD) and subsequent enhancements to IC testing including adaptive scan. Dr. Williams has also been influential in the adoption of these techniques throughout the IC design industry with over 50 publications and 20 patents, thus enhancing the quality and value of today’s electronic products.

Read Full Press Release

Award Dinner Details


Sat, Sep 1st, 2018 |